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3 September 2008 Two-band IR sensing technology with improved temperature and spatial resolution: visualizing light and heat in LEDs
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Abstract
Infrared imaging in the 3-5 and 8-12 μm bands is demonstrated to be extremely fast and spatially resolved characterization technology for testing light and heat in micron-size light emitting devices. It is shown how this high-speed contactless technology coupled with the CCD micro vision can be used to monitor both light and parasitic heat evolution in space (10-μm resolution step) and time (~10 μs temporal scale) in white, near IR, mid-wave IR, and long-wave IR LEDs. The technology appears to be the best way to find out if and where the excess heat emerges and how it affect on the light pattern and device performance. We experimentally demonstrate the non-uniformity in light pattern and local heat traps with giant temperature gradients (>103 K/cm), which affect LED parameters and cause these devices to degrade.
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Volodymyr Malyutenko and Oleg Malyutenko "Two-band IR sensing technology with improved temperature and spatial resolution: visualizing light and heat in LEDs", Proc. SPIE 7055, Infrared Systems and Photoelectronic Technology III, 70550I (3 September 2008); https://doi.org/10.1117/12.794850
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