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25 August 2008 Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition
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Abstract
The speckle that is formed in coherent illumination confuses efforts to record an object's fine details. The confusion is particularly severe in optical metrology and microscopy. In this paper, a scheme using the empirical mode decomposition (EMD) to remove speckles is proposed. This makes it possible to accurately evaluate phases from a fringe pattern illuminated by a coherent light source.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei-Hung Su, Chao-Kuei Lee, and Cheng-Wei Lee "Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition", Proc. SPIE 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II, 70561Q (25 August 2008); https://doi.org/10.1117/12.796697
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