29 August 2008 Development and optical testing of the camera, hand lens, and microscope probe with scannable laser spectroscopy (CHAMP-SLS)
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Abstract
Conducting high resolution field microscopy with coupled laser spectroscopy that can be used to selectively analyze the surface chemistry of individual pixels in a scene is an enabling capability for next generation robotic and manned spaceflight missions, civil, and military applications. In the laboratory, we use a range of imaging and surface preparation tools that provide us with in-focus images, context imaging for identifying features that we want to investigate at high magnification, and surface-optical coupling that allows us to apply optical spectroscopic analysis techniques for analyzing surface chemistry particularly at high magnifications. The camera, handlens, and microscope probe with scannable laser spectroscopy (CHAMP-SLS) is an imaging/spectroscopy instrument capable of imaging continuously from infinity down to high resolution microscopy (resolution of ~1 micron/pixel in a final camera format), the closer CHAMP-SLS is placed to a feature, the higher the resultant magnification. At hand lens to microscopic magnifications, the imaged scene can be selectively interrogated with point spectroscopic techniques such as Raman spectroscopy, microscopic Laser Induced Breakdown Spectroscopy (micro-LIBS), laser ablation mass-spectrometry, Fluorescence spectroscopy, and/or Reflectance spectroscopy. This paper summarizes the optical design, development, and testing of the CHAMP-SLS optics.
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Greg S. Mungas, Greg S. Mungas, Yekta Gürsel, Yekta Gürsel, Cesar A. Sepulveda, Cesar A. Sepulveda, Mark Anderson, Mark Anderson, Clayton La Baw, Clayton La Baw, Kenneth R. Johnson, Kenneth R. Johnson, Matthew Deans, Matthew Deans, Luther Beegle, Luther Beegle, John Boynton, John Boynton, } "Development and optical testing of the camera, hand lens, and microscope probe with scannable laser spectroscopy (CHAMP-SLS)", Proc. SPIE 7060, Current Developments in Lens Design and Optical Engineering IX, 70600O (29 August 2008); doi: 10.1117/12.792024; https://doi.org/10.1117/12.792024
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