11 August 2008 Distortion mapping correction in aspheric null testing
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We describe methods to correct both symmetric and asymmetric distortion mapping errors induced by null testing elements such as holograms or null lenses. We show experimental results for direct measurement and correction of symmetric mapping distortion, as well as an example result for analytical mapping performed using an orthogonal set of vector polynomials for asymmetric correction. The empirical determination of symmetric distortion is made via calculation from predicted and measured changes to aberrations induced via known changes to the testing point.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Novak, M. Novak, C. Zhao, C. Zhao, J. H. Burge, J. H. Burge, } "Distortion mapping correction in aspheric null testing", Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706313 (11 August 2008); doi: 10.1117/12.798151; https://doi.org/10.1117/12.798151


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