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11 August 2008 Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer
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Abstract
Frequently two-dimensional interferograms are obtained when a point-diffraction interferometer (PDI) is used in optical testing. The PDI is a simple, convenient and robust tool for optical shop testing. In this paper, we propose the use of the PDI and placing a slit at the exit pupil to scanning the surface under test. Stitching is then used to generate a phase map of the test wavefront. The advantage of the proposal is the sharpness of the fringes to obtain high resolution contour of the test wavefront, we describe the method and some experimental results.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luis Rodríguez-Castillo, Fermín S. Granados-Agustín, and Alejandro Cornejo-Rodríguez "Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer", Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706315 (11 August 2008); https://doi.org/10.1117/12.795582
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