11 August 2008 Scene-based wavefront correction with spatial light modulators
Author Affiliations +
Proceedings Volume 7064, Interferometry XIV: Applications; 70640M (2008); doi: 10.1117/12.794860
Event: Optical Engineering + Applications, 2008, San Diego, California, United States
Spatial light modulators (SLM) are used in different microscopy setups. Examples are optical tweezers, programmable phase contrast imaging, confocal imaging, and aberration correction. We report on a method that measures and corrects specimen-induced aberrations in wide-field microscopy without additional optical components (e.g. Shack-Hartmann sensors) by taking advantage of the SLM that is already used in the setup. Different local gratings are written into the SLM which is positioned in a plane conjugate to the pupil of the imaging system. Multiple images are recorded and based on the shift of subimages we deduce the wavefront. We demonstrate first experimental results of this method for a system using a high resolution LCoS modulator.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tobias Haist, Jan Hafner, Michael Warber, Wolfgang Osten, "Scene-based wavefront correction with spatial light modulators", Proc. SPIE 7064, Interferometry XIV: Applications, 70640M (11 August 2008); doi: 10.1117/12.794860; https://doi.org/10.1117/12.794860


Spatial light modulators



Wavefront sensors


Aberration correction

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