A fast and accurate image-based measuring system for isotropic reflection materials

Duck Bong Kim; Kang Yeon Kim; Kang Su Park; Myoung Kook Seo; Kwan H. Lee

doi:10.1117/12.793970

29 August 2008 A fast and accurate image-based measuring system for isotropic reflection materials

Duck Bong Kim, Kang Yeon Kim, Kang Su Park, Myoung Kook Seo, Kwan H. Lee

Author Affiliations +

Proceedings Volume 7065, Reflection, Scattering, and Diffraction from Surfaces; 70650I (2008) https://doi.org/10.1117/12.793970
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

We present a novel image-based BRDF (Bidirectional Reflectance Distribution Function) measurement system for materials that have isotropic reflectance properties. Our proposed system is fast due to simple set up and automated operations. It also provides a wide angular coverage and noise reduction capability so that it achieves accuracy that is needed for computer graphics applications. We test the uniformity and constancy of the light source and the reciprocity of the measurement system. We perform a photometric calibration of HDR (High Dynamic Range) camera to recover an accurate radiance map from each HDR image. We verify our proposed system by comparing it with a previous imagebased BRDF measurement system. We demonstrate the efficiency and accuracy of our proposed system by generating photorealistic images of the measured BRDF data that include glossy blue, green plastics, gold coated metal and gold metallic paints.

Citation Download Citation

Duck Bong Kim, Duck Bong Kim, Kang Yeon Kim, Kang Yeon Kim, Kang Su Park, Kang Su Park, Myoung Kook Seo, Myoung Kook Seo, Kwan H. Lee, Kwan H. Lee, "A fast and accurate image-based measuring system for isotropic reflection materials", Proc. SPIE 7065, Reflection, Scattering, and Diffraction from Surfaces, 70650I (29 August 2008); doi: 10.1117/12.793970; https://doi.org/10.1117/12.793970

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