Paper
3 September 2008 Measuring chromatic dispersion using single-arm interferometers: from millimeters to kilometers
Author Affiliations +
Abstract
We present three new interferometric techniques for dispersion characterization covering from millimeter waveguides to kilometers of fibers. The first is a Frequency-Shifted Interferometer (FSI) that measures fibers from meters to tens of kilometers. The second is a three-wave Single-Arm Interferometer (SAI), where the envelope of a three-wave interference pattern yields the second-order dispersion directly. It is suitable for fibers from centimeters to >1m. The third is a Common-Path Interferometer (CPI) that measures dispersion of millimeter-long fibers/waveguides. These techniques offer high precision in their respective ranges, and are all "single-arm" interferometers: the two interfering beams go through the same arm of the interferometer. They are simple, low-cost, and more resilient to phase and polarization instabilities than conventional interferometric techniques for dispersion measurement.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Li Qian, Bing Qi, Waleed S. Mohammed, Michael A. Galle, and Fei Ye "Measuring chromatic dispersion using single-arm interferometers: from millimeters to kilometers", Proc. SPIE 7072, Optics and Photonics for Information Processing II, 70720D (3 September 2008); https://doi.org/10.1117/12.795103
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Dispersion

Interferometers

Optical fibers

Waveguides

Interferometry

Polarization

Calibration

Back to Top