3 September 2008 Measuring chromatic dispersion using single-arm interferometers: from millimeters to kilometers
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Abstract
We present three new interferometric techniques for dispersion characterization covering from millimeter waveguides to kilometers of fibers. The first is a Frequency-Shifted Interferometer (FSI) that measures fibers from meters to tens of kilometers. The second is a three-wave Single-Arm Interferometer (SAI), where the envelope of a three-wave interference pattern yields the second-order dispersion directly. It is suitable for fibers from centimeters to >1m. The third is a Common-Path Interferometer (CPI) that measures dispersion of millimeter-long fibers/waveguides. These techniques offer high precision in their respective ranges, and are all "single-arm" interferometers: the two interfering beams go through the same arm of the interferometer. They are simple, low-cost, and more resilient to phase and polarization instabilities than conventional interferometric techniques for dispersion measurement.
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Li Qian, Li Qian, Bing Qi, Bing Qi, Waleed S. Mohammed, Waleed S. Mohammed, Michael A. Galle, Michael A. Galle, Fei Ye, Fei Ye, } "Measuring chromatic dispersion using single-arm interferometers: from millimeters to kilometers", Proc. SPIE 7072, Optics and Photonics for Information Processing II, 70720D (3 September 2008); doi: 10.1117/12.795103; https://doi.org/10.1117/12.795103
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