3 September 2008 Investigation of polycrystalline structure of CVD diamond using white-beam x-ray diffraction
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Abstract
Polycrystalline structure of a chemical vapor deposited (CVD) diamond vacuum window was investigated by means of white-beam diffraction. Forward Laue diffraction patterns were recorded using two-dimensional flat panel sensor. A computer aided approximate indexation of the Laue spots was performed based on maximum correlation between observed and directly simulated patterns. Different sets of the diffraction patterns were attributed to the different diamond crystalline grains. Retrieved orientations of the illuminated grains were rather random and average linear dimension of the single grain was about 56-64 μm.
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Alexey Souvorov, Alexey Souvorov, Kentaro Kajiwara, Kentaro Kajiwara, Hiroaki Kimura, Hiroaki Kimura, Shunji Goto, Shunji Goto, Tetsuya Ishikawa, Tetsuya Ishikawa, } "Investigation of polycrystalline structure of CVD diamond using white-beam x-ray diffraction", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770N (3 September 2008); doi: 10.1117/12.796683; https://doi.org/10.1117/12.796683
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