Ray traces of an arbitrarily deformed double-crystal Laue x-ray monochromator

John P. Sutter; Thomas Connolley; Michael Drakopoulos; Timothy P. Hill; Doug W. Sharp

doi:10.1117/12.796937

3 September 2008 Ray traces of an arbitrarily deformed double-crystal Laue x-ray monochromator

John P. Sutter, Thomas Connolley, Michael Drakopoulos, Timothy P. Hill, Doug W. Sharp

Proceedings Volume 7077, Advances in X-Ray/EUV Optics and Components III; 70771N (2008) https://doi.org/10.1117/12.796937
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

The Diamond Light Source beamline I12 (JEEP) is installing a monochromator for high-energy (50-150 keV) X-rays. It consists of two highly asymmetrically cut silicon crystals diffracting in the Laue case. These crystals will be bent to increase the bandpass to several hundred eV. It is necessary to estimate the tolerances for the angular alignment and the bending radii, and to account for gravitational and thermal distortions. A simple ray-tracing model has been developed for use with finite-element analyses. For simple cases, this model is backed by more precise wave-optical calculations.

Citation Download Citation

John P. Sutter, Thomas Connolley, Michael Drakopoulos, Timothy P. Hill, and Doug W. Sharp "Ray traces of an arbitrarily deformed double-crystal Laue x-ray monochromator", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70771N (3 September 2008); https://doi.org/10.1117/12.796937

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