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18 September 2008 In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale
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Abstract
High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals and an artificial crack in a metal foil using synchrotron x-radiation. The refractive index profile in the vicinity of the interface and crack of each sample was reconstructed with spatial resolution of about 40-60 nm by the Phase Retrieval X-Ray Diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as an in-situ nondestructive method of characterization of internal interfaces within multiphase materials and crack developing under external force.
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Andrei Y. Nikulin, Aliaksandr V. Darahanau, Ruben A. Dilanian, Barry C. Muddle, Alexei Y. Souvorov, and Osami Sakata "In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale", Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781M (18 September 2008); https://doi.org/10.1117/12.795952
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