4 September 2008 Spectral responses of virtual Frisch-grid CdZnTe detectors and their relation to IR microscopy and x-ray diffraction topography data
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Abstract
Virtual Frisch-grid CdZnTe detectors potentially can provide energy resolution close to the statistical limit. However, in real detectors, the quality of the crystals used to fabricate the devices primarily determines energy resolution. In this paper, we report our findings on the spectral response of devices and their relation to material-characterization data obtained using IR microscopy and X-ray diffraction topography.
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A. E. Bolotnikov, A. E. Bolotnikov, S. Babalola, S. Babalola, G. S. Camarda, G. S. Camarda, Y. Cui, Y. Cui, S. U. Egarievwe, S. U. Egarievwe, P. M. Fochuk, P. M. Fochuk, R. Hawrami, R. Hawrami, A. Hossain, A. Hossain, J. R. James, J. R. James, I. J. Nakonechnyj, I. J. Nakonechnyj, Ge Yang, Ge Yang, R. B. James, R. B. James, } "Spectral responses of virtual Frisch-grid CdZnTe detectors and their relation to IR microscopy and x-ray diffraction topography data", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 707903 (4 September 2008); doi: 10.1117/12.796232; https://doi.org/10.1117/12.796232
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