17 September 2008 Potential of x-ray diffraction for detecting Special Nuclear Materials (SNMs)
Author Affiliations +
A novel detection technique employing x-ray diffraction (XRD) to screen for Special Nuclear Materials (SNMs), in particular for uranium, is presented. It is based on the interesting fact that uranium (and incidentally, plutonium) has a non-cubic lattice structure, in contrast to all other non-SNM, high-density elements of the Periodic Table. Following a brief review of the cubic crystal structures exhibited by high atomic number species such as lead, the departure from cubicity exhibited by room-temperature uranium (orthorhombic) is discussed and its effect on the uranium XRD pattern is examined. The XRD lines of uranium are compared with those of lead, a common high-Z material found in container traffic. Significant differences are evident arising from their different crystal structures. In order to achieve adequate penetration, both of suspicious high-Z materials and their containers, high photon energies must be used. Physical and technological considerations relevant to performing XRD at 1 MeV are discussed and a novel secondary aperture scheme permitting high-energy XRD is presented. It is concluded that the importance of the application and the prospect of its feasibility are sufficient to warrant experimental verification.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Harding, G. Harding, } "Potential of x-ray diffraction for detecting Special Nuclear Materials (SNMs)", Proc. SPIE 7080, Penetrating Radiation Systems and Applications IX, 70800K (17 September 2008); doi: 10.1117/12.800760; https://doi.org/10.1117/12.800760


Mercuric iodide polycrystalline films
Proceedings of SPIE (December 18 2001)
Lead iodide films for x-ray imaging
Proceedings of SPIE (May 01 1997)
Errors in x ray intensity measurements by means of 2D...
Proceedings of SPIE (February 17 1997)
PbI2 for high-resolution digital x-ray imaging
Proceedings of SPIE (October 05 1999)

Back to Top