19 August 2008 Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields
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Abstract
Photonic MEMS technology as it pertains to adaptive coded aperture sensing is an emerging technology offering an increase to imaging performance compared to a fixed system in the EO/IR wavelength region. In this paper we address the effects of potential manufacturing yield and defects. A 1-d first order optical model is developed in an attempt to correlate the optical/system performance to the manufacturing defects and yield output. The imager is found to be extremely robust to both random and correlated failures in the coded aperture, so long as the aperture code is adapted to the aperture failures.
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Oren Sternberg, Esko Jaska, "Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields", Proc. SPIE 7096, Adaptive Coded Aperture Imaging and Non-Imaging Sensors II, 70960H (19 August 2008); doi: 10.1117/12.794029; https://doi.org/10.1117/12.794029
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