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12 August 2008 Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering
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Proceedings Volume 7099, Photonics North 2008; 70991O (2008) https://doi.org/10.1117/12.807478
Event: Photonics North 2008, 2008, Montréal, Canada
Abstract
We review the applications of cladding stress induced birefringence for controlling the polarization dependent properties in SOI waveguide components. In particular, we discuss the phase index and group index birefringence and their dispersion in this high index contrast waveguide platform, and the influence of waveguide cross-section geometry and cladding stress on these properties. Design of broadband polarization independent ring resonators using stress engineering is presented.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dan-Xia Xu, André Delâge, Siegfried Janz, and Pavel Cheben "Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering", Proc. SPIE 7099, Photonics North 2008, 70991O (12 August 2008); https://doi.org/10.1117/12.807478
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