Light scattering to isolate a single interface within a multilayer

Gaëlle Georges; Carole Deumié; Claude Amra

doi:10.1117/12.797634

25 September 2008 Light scattering to isolate a single interface within a multilayer

Gaëlle Georges, Carole Deumié, Claude Amra

Proceedings Volume 7101, Advances in Optical Thin Films III; 71010V (2008) https://doi.org/10.1117/12.797634
Event: Optical Systems Design, 2008, Glasgow, Scotland, United Kingdom

Abstract

Light scattering is a current tool for characterization of defects in optical interferential coatings. However, this tool is not fully efficient for multilayer component. Indeed, in this case, the scattered light from multilayers originates from several interface roughnesses that cannot be separated a priori. In this paper, a technique which can isolate a single interface embedded within a stack is presented. It is based on destructive interferences between the polarization modes of the angular scattering. These interferences can be tuned in a selective way that allows the extraction of light issued from a specific scattering interface.

Citation Download Citation

Gaëlle Georges, Carole Deumié, and Claude Amra "Light scattering to isolate a single interface within a multilayer", Proc. SPIE 7101, Advances in Optical Thin Films III, 71010V (25 September 2008); https://doi.org/10.1117/12.797634

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available