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25 September 2008 Light scattering to isolate a single interface within a multilayer
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Abstract
Light scattering is a current tool for characterization of defects in optical interferential coatings. However, this tool is not fully efficient for multilayer component. Indeed, in this case, the scattered light from multilayers originates from several interface roughnesses that cannot be separated a priori. In this paper, a technique which can isolate a single interface embedded within a stack is presented. It is based on destructive interferences between the polarization modes of the angular scattering. These interferences can be tuned in a selective way that allows the extraction of light issued from a specific scattering interface.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gaëlle Georges, Carole Deumié, and Claude Amra "Light scattering to isolate a single interface within a multilayer", Proc. SPIE 7101, Advances in Optical Thin Films III, 71010V (25 September 2008); https://doi.org/10.1117/12.797634
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