2 October 2008 Controllable time dependent and dual band emission infrared source to test missile warning systems in flight
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Proliferation and technological progress of Mid Wave Infrared (MWIR) sensors for Missile Warning Systems (MWS)1,2 and increased sophistication of countermeasures require demanding in-flight testing. The IR sensors are becoming more sensitive for longer range of detection, the spatial resolution is improving for better target detection and identification, spectral discrimination is being introduced for lower False Alarm Rate (FAR), and the imaging frame rate is increasing for faster defensive reaction. As a result, testing a complex MWS/countermeasure system performance before deployment requires ever more realistic simulation of the threats in their natural backgrounds, and faster measurement of the radiometric output, directionality and time response of the countermeasures. In a previous paper3 we have described a system (IRTS or Infrared Threat Stimulator) we developed to test missile warning systems (MWS) mounted on an aircraft. The IRTS is placed in the field and projects a time dependent infrared beam toward the flying aircraft. The time dependent intensity of the beam simulates the infrared emittance of an approaching missile in the 3 to 5 micron spectral range as sensed by an MWS system. Now we have developed a new system based on the IRTS concept allowing the user to separately control the time profiles of two different infrared ranges independently within the 3 to 5 micron range. This is important because MWS instrumentation now has higher spectral discrimination capability in order to be more missile-specific and less prone to be confused by clutter and background signals. In this paper we describe the new dual band IRTS system and its capability (or Dual Color IRTS, DCIRTS).
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Dario Cabib, Dario Cabib, Larry Davidzon, Larry Davidzon, Amir Gil, Amir Gil, } "Controllable time dependent and dual band emission infrared source to test missile warning systems in flight", Proc. SPIE 7113, Electro-Optical and Infrared Systems: Technology and Applications V, 71130V (2 October 2008); doi: 10.1117/12.800616; https://doi.org/10.1117/12.800616

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