Study of responsiveness of near-field terahertz imaging probes

M. Berta; F. Kadlec

doi:10.1117/12.800207

2 October 2008 Study of responsiveness of near-field terahertz imaging probes

M. Berta, F. Kadlec

Proceedings Volume 7117, Millimetre Wave and Terahertz Sensors and Technology; 71170A (2008) https://doi.org/10.1117/12.800207
Event: SPIE Security + Defence, 2008, Cardiff, Wales, United Kingdom

Abstract

We report on recent measurements and analysis performed with a metal-dielectric near-field terahertz probe. The images obtained with the near-field probe have been decomposed using factor analysis. Components corresponding to the dielectric properties of investigated samples and to the distance of the probe and of the sample have been identified. We further employed the probe for investigation of local anisotropy in a BaTiO3 crystal.

Citation Download Citation

M. Berta and F. Kadlec "Study of responsiveness of near-field terahertz imaging probes", Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170A (2 October 2008); https://doi.org/10.1117/12.800207

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