2 October 2008 Material scanner in the submillimetre-wave region: configuration and signal processing
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Proceedings Volume 7117, Millimetre Wave and Terahertz Sensors and Technology; 71170F (2008); doi: 10.1117/12.800225
Event: SPIE Security + Defence, 2008, Cardiff, Wales, United Kingdom
Abstract
The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.
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C. Krebs, S. Schneider, A. Hommes, D. Nüßler, "Material scanner in the submillimetre-wave region: configuration and signal processing", Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170F (2 October 2008); doi: 10.1117/12.800225; https://doi.org/10.1117/12.800225
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KEYWORDS
Dielectrics

Scanners

Extremely high frequency

Absorption

Glasses

Visualization

Imaging systems

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