2 October 2008 Material scanner in the submillimetre-wave region: configuration and signal processing
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Abstract
The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.
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C. Krebs, S. Schneider, A. Hommes, D. Nüßler, "Material scanner in the submillimetre-wave region: configuration and signal processing", Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170F (2 October 2008); doi: 10.1117/12.800225; https://doi.org/10.1117/12.800225
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