Translator Disclaimer
Paper
6 November 2008 Deep level defect structure of SiC material by local cluster neural network
Author Affiliations +
Proceedings Volume 7124, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008; 712402 (2008) https://doi.org/10.1117/12.817929
Event: Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2008, 2008, Wilga, Poland
Abstract
Main goal of presented work was the construction of neural network for detection of deep defect centers in semiinsulating materials. The element of novelty is the implementation of local cluster function combined with the leave-one-out method, used to determine the appropriate structure of neural net.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tomasz Pichlak and Stanislaw Jankowski "Deep level defect structure of SiC material by local cluster neural network", Proc. SPIE 7124, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008, 712402 (6 November 2008); https://doi.org/10.1117/12.817929
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top