13 October 2008 A new behavioral modeling approach for digital I/O ports
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Abstract
This paper addresses a new and efficient behavioral modeling method of digital I/O ports for EMC and signal integrity simulations. The proposed modeling methodology is based on the fuzzy logic system from port voltage and current transient waveforms. The obtained models can be implemented as SPICE subcircuit conveniently and their accuracy and efficiency are verified by applying to the approach to the characterization of transistor -level models of actual devices.
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Jian-guo Shen, Jian-guo Shen, Min-lan Jiang, Min-lan Jiang, Qinggen Zheng, Qinggen Zheng, Yushun Guo, Yushun Guo, } "A new behavioral modeling approach for digital I/O ports", Proc. SPIE 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence, 71271P (13 October 2008); doi: 10.1117/12.806442; https://doi.org/10.1117/12.806442
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