A new method for fault feature extraction of analog circuit

Qingjian Hou; Hongli Wang

doi:10.1117/12.806551

13 October 2008 A new method for fault feature extraction of analog circuit

Qingjian Hou, Hongli Wang

Proceedings Volume 7128, Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment; 71280K (2008) https://doi.org/10.1117/12.806551
Event: Seventh International Symposium on Instrumentation and Control Technology, 2008, Beijing, China

Abstract

The feature extraction is one of key steps in fault diagnosis. A method of least square support vector machine (LSSVM) is put forward based on genetic optimization to restrain the end effect of empirical mode decomposition (EMD). Based on the method, a method of feature extraction is put forward. The energy of intrinsic mode functions (IMF) generated from EMD is to be the feature to distinguishing faults. The result of feature extraction experiment of analog circuit shows that the method is effective.

Citation Download Citation

Qingjian Hou and Hongli Wang "A new method for fault feature extraction of analog circuit", Proc. SPIE 7128, Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment, 71280K (13 October 2008); https://doi.org/10.1117/12.806551

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