31 December 2008 Measurement technology of image contrast based on CCD
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Proceedings Volume 7130, Fourth International Symposium on Precision Mechanical Measurements; 713040 (2008) https://doi.org/10.1117/12.819703
Event: Fourth International Symposium on Precision Mechanical Measurements, 2008, Anhui, China
Abstract
This paper introduces a new high accuracy measuring method for dimension measurement in industry and a new concept of measurement of image contrast. The new point is to use algorithm of subpixel based on spatial moments and technology of image contrast estimate the exact location of edge within a pixel. The non-linear filter, edge location and subpixel applied in measurement are discussed. More important with the spatial moment and the subdivision technology the accuracy of edge location is improved lots. Real time industrial measure results demonstrates the super advantage of high accuracy dimensional measurement technology be maximum bias within 0.01 mm. Conclusion and discussion are given finally.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pengfei Hao, Pengfei Hao, Wenji Si, Wenji Si, Xiaodong Zhang, Xiaodong Zhang, Yuanzong Li, Yuanzong Li, Lihong Zheng, Lihong Zheng, } "Measurement technology of image contrast based on CCD", Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713040 (31 December 2008); doi: 10.1117/12.819703; https://doi.org/10.1117/12.819703
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