Paper
31 December 2008 A new phase error compensation method of 3-D shape measurement system using DMD projector
Haihua Cui, Xiaosheng Cheng, Ning Dai, Tianran Yuan, Wenhe Liao
Author Affiliations +
Proceedings Volume 7130, Fourth International Symposium on Precision Mechanical Measurements; 713041 (2008) https://doi.org/10.1117/12.819704
Event: Fourth International Symposium on Precision Mechanical Measurements, 2008, Anhui, China
Abstract
Structured light system using a digital micro-mirror device (DMD) projector is increasingly used for a 3-D shape measurement because of its digital nature. When the DMD projector is used in phase measuring profilometer (PMP), the precision of profile measurement will increase with the precision of phase-shift increasing. But the non-sinusoidal nature of the projected fringe patterns causes significant phase measurement error and consequent shape measurement error. In the reality, we find that the non-sinusoidal effect is never caused by only one factor. A real measurement shows that it is a combination of influences by all effects, e.g., the object independent irradiance function, the nonlinear gamma curve of the projector, the spatio-temporal characteristic of DMD, etc. In view of the above factors, a comprehensive compensation method is proposed to compensate these factors for the 3D measurement. If the compensation is well accomplished, the measurement error can be reduced average 6 times. The experiment is carried out to demonstrate the validity of this technique.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haihua Cui, Xiaosheng Cheng, Ning Dai, Tianran Yuan, and Wenhe Liao "A new phase error compensation method of 3-D shape measurement system using DMD projector", Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713041 (31 December 2008); https://doi.org/10.1117/12.819704
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Cited by 3 scholarly publications.
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KEYWORDS
Digital micromirror devices

Projection systems

3D metrology

Error analysis

Phase measurement

Evolutionary algorithms

Fringe analysis

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