PROCEEDINGS VOLUME 7133
INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY | 15-18 SEPTEMBER 2008
Fifth International Symposium on Instrumentation Science and Technology
Editor(s): Jiubin Tan, Xianfang Wen
INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY
15-18 September 2008
Shenyang, China
Front Matter: Volume 7133
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713301 (23 January 2009); doi: 10.1117/12.821543
Instrument Science: Fundamental Theory and Methodology
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713302 (12 January 2009); doi: 10.1117/12.807564
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713303 (12 January 2009); doi: 10.1117/12.811358
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713304 (12 January 2009); doi: 10.1117/12.810474
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713305 (12 January 2009); doi: 10.1117/12.811288
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713306 (12 January 2009); doi: 10.1117/12.810608
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713307 (12 January 2009); doi: 10.1117/12.810637
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713308 (12 January 2009); doi: 10.1117/12.807526
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713309 (12 January 2009); doi: 10.1117/12.807691
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330A (12 January 2009); doi: 10.1117/12.821216
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330B (12 January 2009); doi: 10.1117/12.810756
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330C (12 January 2009); doi: 10.1117/12.810624
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330D (12 January 2009); doi: 10.1117/12.821217
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330E (12 January 2009); doi: 10.1117/12.810121
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330F (12 January 2009); doi: 10.1117/12.807791
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330G (12 January 2009); doi: 10.1117/12.821218
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330H (12 January 2009); doi: 10.1117/12.821219
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330I (12 January 2009); doi: 10.1117/12.821220
Instruments and Systems
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330J (12 January 2009); doi: 10.1117/12.821221
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330K (12 January 2009); doi: 10.1117/12.807678
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330L (12 January 2009); doi: 10.1117/12.821222
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330M (12 January 2009); doi: 10.1117/12.821223
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330N (12 January 2009); doi: 10.1117/12.807545
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330O (12 January 2009); doi: 10.1117/12.807608
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330P (12 January 2009); doi: 10.1117/12.807912
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330Q (12 January 2009); doi: 10.1117/12.812085
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330R (12 January 2009); doi: 10.1117/12.810437
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330S (12 January 2009); doi: 10.1117/12.810452
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330T (12 January 2009); doi: 10.1117/12.808588
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330U (12 January 2009); doi: 10.1117/12.807527
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330V (12 January 2009); doi: 10.1117/12.807615
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330W (12 January 2009); doi: 10.1117/12.810488
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330X (12 January 2009); doi: 10.1117/12.810627
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330Y (12 January 2009); doi: 10.1117/12.821224
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330Z (12 January 2009); doi: 10.1117/12.821225
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713310 (12 January 2009); doi: 10.1117/12.808385
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713311 (12 January 2009); doi: 10.1117/12.807694
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713312 (12 January 2009); doi: 10.1117/12.812090
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713313 (12 January 2009); doi: 10.1117/12.807261
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713314 (12 January 2009); doi: 10.1117/12.807623
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713315 (12 January 2009); doi: 10.1117/12.807260
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713316 (12 January 2009); doi: 10.1117/12.807624
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713317 (12 January 2009); doi: 10.1117/12.807896
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713318 (12 January 2009); doi: 10.1117/12.810606
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713319 (12 January 2009); doi: 10.1117/12.819524
Sensors and Converters
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331A (12 January 2009); doi: 10.1117/12.807946
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331B (12 January 2009); doi: 10.1117/12.810456
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331C (12 January 2009); doi: 10.1117/12.821226
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331D (12 January 2009); doi: 10.1117/12.821227
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331E (12 January 2009); doi: 10.1117/12.807899
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331F (12 January 2009); doi: 10.1117/12.807894
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331G (12 January 2009); doi: 10.1117/12.810623
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331I (12 January 2009); doi: 10.1117/12.810653
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331J (12 January 2009); doi: 10.1117/12.810654
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331K (12 January 2009); doi: 10.1117/12.821255
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331L (12 January 2009); doi: 10.1117/12.807346
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331M (12 January 2009); doi: 10.1117/12.810238
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331N (12 January 2009); doi: 10.1117/12.808402
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331O (12 January 2009); doi: 10.1117/12.821228
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331P (12 January 2009); doi: 10.1117/12.827276
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331Q (12 January 2009); doi: 10.1117/12.821229
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331R (12 January 2009); doi: 10.1117/12.821230
Signal and Image Processing
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331S (12 January 2009); doi: 10.1117/12.821231
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331T (12 January 2009); doi: 10.1117/12.806777
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331U (12 January 2009); doi: 10.1117/12.808437
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331V (12 January 2009); doi: 10.1117/12.810596
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331W (12 January 2009); doi: 10.1117/12.807559
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331X (12 January 2009); doi: 10.1117/12.807695
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331Y (12 January 2009); doi: 10.1117/12.821232
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331Z (12 January 2009); doi: 10.1117/12.810601
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713320 (12 January 2009); doi: 10.1117/12.807706
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713321 (12 January 2009); doi: 10.1117/12.815008
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713322 (12 January 2009); doi: 10.1117/12.810514
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713323 (12 January 2009); doi: 10.1117/12.808730
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713324 (12 January 2009); doi: 10.1117/12.821233
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713325 (12 January 2009); doi: 10.1117/12.813972
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713326 (12 January 2009); doi: 10.1117/12.810633
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713327 (12 January 2009); doi: 10.1117/12.814039
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713328 (12 January 2009); doi: 10.1117/12.814054
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713329 (12 January 2009); doi: 10.1117/12.821234
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332A (12 January 2009); doi: 10.1117/12.821235
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332B (12 January 2009); doi: 10.1117/12.821236
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332C (12 January 2009); doi: 10.1117/12.807569
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332D (12 January 2009); doi: 10.1117/12.808614
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332E (12 January 2009); doi: 10.1117/12.810442
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332F (12 January 2009); doi: 10.1117/12.810622
Electromagnetic Measurement and Automated Testing
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332G (12 January 2009); doi: 10.1117/12.810610
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332H (12 January 2009); doi: 10.1117/12.810595
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332I (12 January 2009); doi: 10.1117/12.810638
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332J (12 January 2009); doi: 10.1117/12.821237
Laser Measurement Techniques and Instruments
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332K (12 January 2009); doi: 10.1117/12.821238
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332L (12 January 2009); doi: 10.1117/12.810008
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332M (12 January 2009); doi: 10.1117/12.810573
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332N (12 January 2009); doi: 10.1117/12.808962
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332O (12 January 2009); doi: 10.1117/12.806589
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332P (12 January 2009); doi: 10.1117/12.810484
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332Q (12 January 2009); doi: 10.1117/12.810132
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332R (12 January 2009); doi: 10.1117/12.810436
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332S (12 January 2009); doi: 10.1117/12.810568
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332T (12 January 2009); doi: 10.1117/12.810598
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332U (12 January 2009); doi: 10.1117/12.810485
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332V (12 January 2009); doi: 10.1117/12.821239
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332W (12 January 2009); doi: 10.1117/12.812415
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332X (12 January 2009); doi: 10.1117/12.810576
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332Y (12 January 2009); doi: 10.1117/12.814964
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332Z (12 January 2009); doi: 10.1117/12.821240
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713330 (12 January 2009); doi: 10.1117/12.821241
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713331 (12 January 2009); doi: 10.1117/12.821242
Holography and Diffraction Optics and Instruments
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713332 (12 January 2009); doi: 10.1117/12.810014
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713333 (12 January 2009); doi: 10.1117/12.821243
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713334 (12 January 2009); doi: 10.1117/12.807543
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713335 (12 January 2009); doi: 10.1117/12.811105
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713336 (12 January 2009); doi: 10.1117/12.810640
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713337 (12 January 2009); doi: 10.1117/12.813382
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713338 (12 January 2009); doi: 10.1117/12.821244
Advanced Optics Measurement Techniques
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713339 (12 January 2009); doi: 10.1117/12.808821
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333A (12 January 2009); doi: 10.1117/12.807534
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333B (12 January 2009); doi: 10.1117/12.821245
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333C (12 January 2009); doi: 10.1117/12.807618
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333D (12 January 2009); doi: 10.1117/12.807778
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333E (12 January 2009); doi: 10.1117/12.808950
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333F (12 January 2009); doi: 10.1117/12.810482
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333G (12 January 2009); doi: 10.1117/12.806310
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333H (12 January 2009); doi: 10.1117/12.808391
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333I (12 January 2009); doi: 10.1117/12.821246
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333J (12 January 2009); doi: 10.1117/12.809987
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333K (12 January 2009); doi: 10.1117/12.805634
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333L (12 January 2009); doi: 10.1117/12.821247
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333M (12 January 2009); doi: 10.1117/12.821248
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333N (12 January 2009); doi: 10.1117/12.821249
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333O (12 January 2009); doi: 10.1117/12.821250
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333P (12 January 2009); doi: 10.1117/12.812398
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333Q (12 January 2009); doi: 10.1117/12.823464
Optoelectronics System Design and Optoelectronic Instruments
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333R (12 January 2009); doi: 10.1117/12.808154
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333S (12 January 2009); doi: 10.1117/12.807879