12 January 2009 High-speed random equivalent sampling system for time-domain reflectometry
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Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71330W (2009) https://doi.org/10.1117/12.810488
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
Time domain reflectometry (TDR) has been commonly used for testing cable for years. The waveform attenuation and distortion of TDR pulse is an inherent problem for the correct definition of arrival time and propagation velocity of traveling wave. For the purpose of obtaining the required information of incident and reflected pulse waveform, a highspeed random equivalent sampling (RES) system with 65ps sampling resolution is proposed for a high-resolution TDR. The problem of data storage and communication caused by high sampling rate is solved by using both digital signal processors (DSP) and field programmable gate arrays (FPGA). The detail architecture of the implemented circuit and software is described, including the control logic and data processing algorithm. The real-time sampling rate of the system is up to 125MHz, with 15.4GHz equivalent sampling bandwidth. The test results show that the proposed system can be used as a high-speed data acquisition and processing unit.
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Jian-hui Song, Feng Yuan, Zhen-liang Ding, "High-speed random equivalent sampling system for time-domain reflectometry", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330W (12 January 2009); doi: 10.1117/12.810488; https://doi.org/10.1117/12.810488
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