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12 January 2009 Pavement roughness measurement based on structure light
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Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71332X (2009) https://doi.org/10.1117/12.810576
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
Pavement roughness is an important index to reflect the quality of pavement. To improve the efficiency of pavement roughness measurement, a novel pavement roughness measurement system based on structured light vision inspection is proposed in this paper. By describing the principle of structured light inspection and measurement system design, it is stressed that the proposed system can be used to acquire a continuous longitudinal profile of pavement and International Roughness Index by using the structured light illumination and CCD. Some experiments are performed to test orientation precision and performance of the system. The experimental results show that the system has some pros such as high orientation precision, good stability and low cost.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
WanYu Liu, Xiaoming Sun, Jian Ping Huang, and Kai Xie "Pavement roughness measurement based on structure light", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332X (12 January 2009); https://doi.org/10.1117/12.810576
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