The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array

Xiqu Chen

doi:10.1117/12.802939

18 November 2008 The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array

Xiqu Chen

Proceedings Volume 7135, Optoelectronic Materials and Devices III; 713539 (2008) https://doi.org/10.1117/12.802939
Event: Asia-Pacific Optical Communications, 2008, Hangzhou, China

Abstract

The readout integrated circuit (ROIC) for micro-bolometric infrared focal plane array (IRFPA) is commonly fabricated in silicon complementary metal oxide semiconductor field effect transistor (CMOS) technology. There are three main categories of noise in a typical CMOS ROIC, which are 1/f noise, KTC noise and fixed pattern noise. These noises in CMOS ROIC can seriously restrain the dynamic range of the ROIC and degrade the performance of IRFPA. A new CMOS ROIC for micro-bolometric IRFPA is designed to suppress the noises, and its performance is successfully verified through the theory analysis and experimental results in this paper.

Citation Download Citation

Xiqu Chen "The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array", Proc. SPIE 7135, Optoelectronic Materials and Devices III, 713539 (18 November 2008); https://doi.org/10.1117/12.802939

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