18 November 2008 The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array
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Proceedings Volume 7135, Optoelectronic Materials and Devices III; 713539 (2008) https://doi.org/10.1117/12.802939
Event: Asia-Pacific Optical Communications, 2008, Hangzhou, China
Abstract
The readout integrated circuit (ROIC) for micro-bolometric infrared focal plane array (IRFPA) is commonly fabricated in silicon complementary metal oxide semiconductor field effect transistor (CMOS) technology. There are three main categories of noise in a typical CMOS ROIC, which are 1/f noise, KTC noise and fixed pattern noise. These noises in CMOS ROIC can seriously restrain the dynamic range of the ROIC and degrade the performance of IRFPA. A new CMOS ROIC for micro-bolometric IRFPA is designed to suppress the noises, and its performance is successfully verified through the theory analysis and experimental results in this paper.
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Xiqu Chen, Xiqu Chen, } "The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array", Proc. SPIE 7135, Optoelectronic Materials and Devices III, 713539 (18 November 2008); doi: 10.1117/12.802939; https://doi.org/10.1117/12.802939
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