20 November 2008 Determination of third-order aberration coefficients from spherical aberration measurement
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Proceedings Volume 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 71411Z (2008) https://doi.org/10.1117/12.822417
Event: 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2008, Polanica Zdroj, Poland
Abstract
The imaging quality of an optical system depends on the magnitude of residual aberrations of the optical system. Aberrations of optical systems can be analytically expressed as a sum of aberrations of different orders. The most important for practice are the third-order aberrations (Seidel aberrations) and the fifth-order aberrations. Our work shows one of possible methods for determination of third-order aberration coefficients that is based on measurement of spherical aberration of the investigated optical system. The advantage of this method for determination of the third-order aberration coefficients is the fact that the measurement of spherical aberration can be experimentally relatively easily performed with a sufficient accuracy. This work presents a detailed theoretical analysis of the proposed method and relations for calculation of the third-order aberration coefficients.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antonin Miks, Antonin Miks, Jiri Novak, Jiri Novak, Pavel Novak, Pavel Novak, } "Determination of third-order aberration coefficients from spherical aberration measurement", Proc. SPIE 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 71411Z (20 November 2008); doi: 10.1117/12.822417; https://doi.org/10.1117/12.822417
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