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3 October 2008 High-resolution interferometry with Nd:YAG laser for local probe microscopy
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Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 71550L (2008) https://doi.org/10.1117/12.814520
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore
Abstract
We present a system of positioning a sample for various types of local probe microscopes with interferometric measurement of displacement. The positioning extends significantly the field of view of the local probe microscopy where not only the probe can be displaced over a small range by piezoelectric transducers but the sample can be positioned over a larger scale. The stage allows positioning with nanometer resolution in all three axes under a closed loop control with position detection via capacitive sensors. Interferometric system monitoring all six degrees of freedom of the stage ensures full metrological traceability of the positioning to the fundamental etalon of length and improves resolution and overall precision of the displacement monitoring.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Josef Lazar, Ondřej Číp, Martin Čížek, and Mojmír Šerý "High-resolution interferometry with Nd:YAG laser for local probe microscopy", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71550L (3 October 2008); https://doi.org/10.1117/12.814520
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