3 October 2008 A polarization sensitive interferometer for stress analysis
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Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 715519 (2008) https://doi.org/10.1117/12.814545
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore
Abstract
In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mahuya Sarkar, S. K. Sarkar, A. Basuray, "A polarization sensitive interferometer for stress analysis", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715519 (3 October 2008); doi: 10.1117/12.814545; https://doi.org/10.1117/12.814545
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