3 October 2008 A polarization sensitive interferometer for stress analysis
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Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 715519 (2008) https://doi.org/10.1117/12.814545
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore
Abstract
In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.
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Mahuya Sarkar, Mahuya Sarkar, S. K. Sarkar, S. K. Sarkar, A. Basuray, A. Basuray, } "A polarization sensitive interferometer for stress analysis", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715519 (3 October 2008); doi: 10.1117/12.814545; https://doi.org/10.1117/12.814545
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