Design of laser source for fiber point diffraction interferometer

Xun Yu; Liang Nie; Jun Han; Baoyuan Liu; Xu Jiang

doi:10.1117/12.814602

3 October 2008 Design of laser source for fiber point diffraction interferometer

Xun Yu; Liang Nie; Jun Han; Baoyuan Liu; Xu Jiang

Author Affiliations +

Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 71552S (2008) https://doi.org/10.1117/12.814602
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore

Abstract

The fiber point-diffraction interferometer is introduced for measuring spherical surface with high precision. The interferometer must use special laser source, the coherence length of which is no more than 10 cm. The laser source at present can not meet the demand and the research of laser source design is performed in this paper. The coherence length of laser source in experiment is inconsistent with that computed with general theory, which restrict the research progress. In this paper, Mutual Coherence Function is introduced to describe the coherence of optical field. Based on the spectral characteristic of laser source, the mode of Multi-Longitudinal Mode laser is built. Through numerical calculation, it is discussed that how coherence degree is related with Longitudinal Mode number, spectral half width and resonant cavity length. Some important conclusions are draw. For example, Multi-Longitudinal Mode laser source has periodic coherence degree no matter how many longitudinal modes it contains, and the period of laser coherence degree is always double resonant cavity length. The method for designing short coherence length laser is put forward based on the conclusions and its coherence is measured in experiment. The result shows that the coherence length reaches 5 cm and meets the need of the interferometer.

Citation Download Citation

Xun Yu, Xun Yu, Liang Nie, Liang Nie, Jun Han, Jun Han, Baoyuan Liu, Baoyuan Liu, Xu Jiang, Xu Jiang, } "Design of laser source for fiber point diffraction interferometer", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71552S (3 October 2008); doi: 10.1117/12.814602; https://doi.org/10.1117/12.814602

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years