PROCEEDINGS VOLUME 7156
INTERNATIONAL CONFERENCE OF OPTICAL INSTRUMENT AND TECHNOLOGY | 16-19 NOVEMBER 2008
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
IN THIS VOLUME

14 Sessions, 127 Papers, 0 Presentations
Session 1  (4)
Session 2  (4)
Session 3  (1)
Session 4  (4)
Session 5  (5)
Session 6  (3)
Session 7  (6)
Session 8  (4)
Session 9  (4)
Session 10  (3)
Session 11  (4)
Session 12  (3)
INTERNATIONAL CONFERENCE OF OPTICAL INSTRUMENT AND TECHNOLOGY
16-19 November 2008
Beijing, China
Front Matter: Volume 7156
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715601 (3 February 2009); doi: 10.1117/12.824432
Session 1
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715602 (27 January 2009); doi: 10.1117/12.812053
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715603 (27 January 2009); doi: 10.1117/12.811856
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715604 (27 January 2009); doi: 10.1117/12.806381
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715605 (27 January 2009); doi: 10.1117/12.805472
Session 2
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715606 (27 January 2009); doi: 10.1117/12.806813
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715607 (27 January 2009); doi: 10.1117/12.807008
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715608 (27 January 2009); doi: 10.1117/12.806600
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715609 (27 January 2009); doi: 10.1117/12.806808
Session 3
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560A (27 January 2009); doi: 10.1117/12.806612
Session 4
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560B (27 January 2009); doi: 10.1117/12.807105
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560C (27 January 2009); doi: 10.1117/12.811845
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560D (27 January 2009); doi: 10.1117/12.811451
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560E (27 January 2009); doi: 10.1117/12.807561
Session 5
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560F (27 January 2009); doi: 10.1117/12.816955
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560G (27 January 2009); doi: 10.1117/12.806947
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560H (27 January 2009); doi: 10.1117/12.806528
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560I (27 January 2009); doi: 10.1117/12.810786
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560J (27 January 2009); doi: 10.1117/12.805793
Session 6
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560K (27 January 2009); doi: 10.1117/12.806070
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560L (27 January 2009); doi: 10.1117/12.806309
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560M (27 January 2009); doi: 10.1117/12.806903
Session 7
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560N (27 January 2009); doi: 10.1117/12.807224
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560O (27 January 2009); doi: 10.1117/12.806890
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560P (27 January 2009); doi: 10.1117/12.806129
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560Q (27 January 2009); doi: 10.1117/12.810962
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560R (27 January 2009); doi: 10.1117/12.806676
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560S (27 January 2009); doi: 10.1117/12.811524
Session 8
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560T (27 January 2009); doi: 10.1117/12.806182
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560U (27 January 2009); doi: 10.1117/12.805676
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560V (27 January 2009); doi: 10.1117/12.810810
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560W (27 January 2009); doi: 10.1117/12.810884
Session 9
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560X (27 January 2009); doi: 10.1117/12.807073
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560Y (27 January 2009); doi: 10.1117/12.807262
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560Z (27 January 2009); doi: 10.1117/12.810805
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715610 (27 January 2009); doi: 10.1117/12.806942
Session 10
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715611 (27 January 2009); doi: 10.1117/12.810788
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715612 (28 January 2009); doi: 10.1117/12.811434
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715613 (28 January 2009); doi: 10.1117/12.806772
Session 11
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715614 (28 January 2009); doi: 10.1117/12.811437
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715615 (28 January 2009); doi: 10.1117/12.807125
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715616 (28 January 2009); doi: 10.1117/12.807115
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715617 (28 January 2009); doi: 10.1117/12.805585
Session 12
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715618 (28 January 2009); doi: 10.1117/12.805674
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715619 (28 January 2009); doi: 10.1117/12.806671
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561A (28 January 2009); doi: 10.1117/12.807039
Poster Session
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561B (28 January 2009); doi: 10.1117/12.804777
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561C (28 January 2009); doi: 10.1117/12.805420
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561D (28 January 2009); doi: 10.1117/12.805491
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561E (28 January 2009); doi: 10.1117/12.805496
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561F (28 January 2009); doi: 10.1117/12.805544
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561H (28 January 2009); doi: 10.1117/12.805654
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561I (28 January 2009); doi: 10.1117/12.805707
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561J (28 January 2009); doi: 10.1117/12.805870
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561K (28 January 2009); doi: 10.1117/12.806126
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561L (28 January 2009); doi: 10.1117/12.806146
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561M (28 January 2009); doi: 10.1117/12.806373
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561N (28 January 2009); doi: 10.1117/12.806430
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561O (28 January 2009); doi: 10.1117/12.806529
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561P (28 January 2009); doi: 10.1117/12.806585
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561Q (28 January 2009); doi: 10.1117/12.806586
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561R (28 January 2009); doi: 10.1117/12.806597
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561S (28 January 2009); doi: 10.1117/12.806698
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561T (28 January 2009); doi: 10.1117/12.806704
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561U (28 January 2009); doi: 10.1117/12.806710
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561V (28 January 2009); doi: 10.1117/12.806711
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561W (28 January 2009); doi: 10.1117/12.806760
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561X (28 January 2009); doi: 10.1117/12.806762
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561Y (28 January 2009); doi: 10.1117/12.806811
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561Z (28 January 2009); doi: 10.1117/12.806825
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715620 (28 January 2009); doi: 10.1117/12.806833
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715621 (28 January 2009); doi: 10.1117/12.806918
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715622 (28 January 2009); doi: 10.1117/12.806920
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715623 (28 January 2009); doi: 10.1117/12.806926
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715624 (28 January 2009); doi: 10.1117/12.806937
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715625 (28 January 2009); doi: 10.1117/12.806938
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715626 (28 January 2009); doi: 10.1117/12.806945
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715627 (28 January 2009); doi: 10.1117/12.806966
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715628 (28 January 2009); doi: 10.1117/12.806967
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715629 (28 January 2009); doi: 10.1117/12.806969
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562A (28 January 2009); doi: 10.1117/12.806985
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562B (28 January 2009); doi: 10.1117/12.807025
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562C (28 January 2009); doi: 10.1117/12.807026
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562D (28 January 2009); doi: 10.1117/12.807031
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562E (28 January 2009); doi: 10.1117/12.807032
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562F (28 January 2009); doi: 10.1117/12.807052
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562G (28 January 2009); doi: 10.1117/12.807055
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562H (28 January 2009); doi: 10.1117/12.807063
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562I (28 January 2009); doi: 10.1117/12.807067
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562J (28 January 2009); doi: 10.1117/12.807069
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562K (28 January 2009); doi: 10.1117/12.807083
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562L (28 January 2009); doi: 10.1117/12.807096
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562M (28 January 2009); doi: 10.1117/12.807102
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562N (28 January 2009); doi: 10.1117/12.807110
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562O (28 January 2009); doi: 10.1117/12.807137
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562P (28 January 2009); doi: 10.1117/12.807341
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Q (28 January 2009); doi: 10.1117/12.807701
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562R (28 January 2009); doi: 10.1117/12.810876
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562S (28 January 2009); doi: 10.1117/12.811070
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562T (28 January 2009); doi: 10.1117/12.811313
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562U (28 January 2009); doi: 10.1117/12.811350
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562V (28 January 2009); doi: 10.1117/12.811351
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562W (28 January 2009); doi: 10.1117/12.811398
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562X (28 January 2009); doi: 10.1117/12.811502
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Y (28 January 2009); doi: 10.1117/12.811503
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Z (28 January 2009); doi: 10.1117/12.811780
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715630 (28 January 2009); doi: 10.1117/12.811793
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715631 (28 January 2009); doi: 10.1117/12.811794
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715632 (28 January 2009); doi: 10.1117/12.811799
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715633 (28 January 2009); doi: 10.1117/12.811810
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715634 (28 January 2009); doi: 10.1117/12.811951
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715635 (28 January 2009); doi: 10.1117/12.811959
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715636 (28 January 2009); doi: 10.1117/12.811963
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715637 (28 January 2009); doi: 10.1117/12.811967
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715638 (28 January 2009); doi: 10.1117/12.811968
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715639 (28 January 2009); doi: 10.1117/12.811973
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563A (28 January 2009); doi: 10.1117/12.811974
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563B (28 January 2009); doi: 10.1117/12.811975
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563C (28 January 2009); doi: 10.1117/12.812004
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563D (28 January 2009); doi: 10.1117/12.812022
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563E (28 January 2009); doi: 10.1117/12.812026
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563F (28 January 2009); doi: 10.1117/12.812114
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563G (28 January 2009); doi: 10.1117/12.816954
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563H (28 January 2009); doi: 10.1117/12.819859
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563I (28 January 2009); doi: 10.1117/12.819857
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563M (28 January 2009); doi: 10.1117/12.805466
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71564D (28 January 2009); doi: 10.1117/12.811778
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