Paper
27 January 2009 Research on the phase unwrapping theory of the surface roughness measurement system based on LabVIEW
Author Affiliations +
Abstract
The roughness of the surface is an important parameter that reflects the quality of the object. Optical methods are the usual ways to measure the surface roughness including scattering method, speckle method, interferometric method and optical stylus method. But they are highly required the precision of the mechanism and they are not convenient to realize the automatic measurement. To improve the structure and the automatic performance, this surface roughness measurement system is based on the theory of two-dimensional phase unwrapping that is widely used in aerophotogrammetry. With the theory, the three dimensional data can be calculated from the images detected. The difference is that the image is captured by radar in aerophotogrammetrytly while it is got by using optical structure in this system. The images are got through the optical structure with the structured light. To control the phase of the light, the gratings is used in the system controlled by the piezoelectric ceramics. The phase information is contained in the image and captured by the CCD camera. To analyze the images captured through the optical system, the phase should be extracted from the images through complex operation to generate the phase map. The quality-guided algorithm is the main algorithm in this system. LabVIEW is the main software development environment and the massive calculation is accomplished in the dynamic linked library complied by Visual C++ to realize the image processing. Through the stereogram showed in the software we can clearly get the three dimensional information of the surface.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Zhong, Xiang-ning Li, and Zhong-he Huang "Research on the phase unwrapping theory of the surface roughness measurement system based on LabVIEW", Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715621 (27 January 2009); https://doi.org/10.1117/12.806918
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KEYWORDS
LabVIEW

Image processing

Surface roughness

C++

Ceramics

Visualization

Control systems

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