Trace H2S monitoring based on off-axis integrated cavity output spectroscopy

Dahai Yu; Xia Li; Haitao Gu; Xiumin Gao; Wei Huang; Yu Zhang; Haibo Ma; Zhiwei Ma; Pingbo Gao; Wenmin Zhen; Ying Li; Yu Qi; Luhong Wen; Jian Wang

doi:10.1117/12.806966

28 January 2009 Trace H₂S monitoring based on off-axis integrated cavity output spectroscopy

Dahai Yu, Xia Li, Haitao Gu, Xiumin Gao, Wei Huang, Yu Zhang, Haibo Ma, Zhiwei Ma, Pingbo Gao, Wenmin Zhen, Ying Li, Yu Qi, Luhong Wen, Jian Wang

Author Affiliations +

Proceedings Volume 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments; 715627 (2009) https://doi.org/10.1117/12.806966
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

The trace H₂S in range of 0-20ppm has been measured by means of off-axis integrated cavity output spectroscopy (OA-ICOS) technology combined with tunable diode laser absorption spectroscopy (TDLAS) technology. The instrument uses off-axis alignment geometry to eliminate the problem of mode matching between laser and optical resonant cavity, in absenting the piezoelectric transducer. Combined with the high sensitivity of the TDLAS technology, sensitivity of the instrument is improved. The repeatability of instrument in H₂S measurement achieves to 0.303ppm (3σ), linearity less than ±1% F.S., which meet the requirement of trace H₂S measurement in petrochemical or natural gas industry.

Citation Download Citation

Dahai Yu, Xia Li, Haitao Gu, Xiumin Gao, Wei Huang, Yu Zhang, Haibo Ma, Zhiwei Ma, Pingbo Gao, Wenmin Zhen, Ying Li, Yu Qi, Luhong Wen, and Jian Wang "Trace H₂S monitoring based on off-axis integrated cavity output spectroscopy", Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715627 (28 January 2009); https://doi.org/10.1117/12.806966

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