9 February 2009 A phase feature extraction technique for terahertz reflection spectroscopy
Author Affiliations +
Abstract
We present a phase feature extraction technique for weakly polarized organic compounds in THz-RTDS by taking the second derivative of the phase of the signal beam with respect to frequency. In nitrogen purged environment this method doesn't require any reference. In real scenarios, a reference beam is applied only to remove the influence of atmospheric attenuation. This method offers a straightforward and speedy way to retrieve the absorption features in the reflection spectrum without the presence of the amplitude of the THz pulse or the settlement of a reference surface. It opens the pathways for the application of a more un-conventional THz emission mechanism and extends the capability of THz sensing technology into more practical sensing and imaging situations.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cunlin Zhang, Cunlin Zhang, Hua Zhong, Hua Zhong, Liangliang Zhang, Liangliang Zhang, } "A phase feature extraction technique for terahertz reflection spectroscopy", Proc. SPIE 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration, 71580Q (9 February 2009); doi: 10.1117/12.807220; https://doi.org/10.1117/12.807220
PROCEEDINGS
14 PAGES


SHARE
RELATED CONTENT

Optical properties of human nails in THz frequency range
Proceedings of SPIE (March 24 2017)
THz wave standoff detection of explosive materials
Proceedings of SPIE (May 19 2006)
Terahertz spectrum of Acesulfame-K
Proceedings of SPIE (November 04 2010)
Terahertz spectrum of gallic acid
Proceedings of SPIE (November 18 2009)

Back to Top