PROCEEDINGS VOLUME 7160
INTERNATIONAL CONFERENCE OF OPTICAL INSTRUMENT AND TECHNOLOGY | 16-19 NOVEMBER 2008
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
IN THIS VOLUME

12 Sessions, 111 Papers, 0 Presentations
Session 1  (5)
Session 2  (4)
Session 3  (4)
Session 4  (5)
Session 5  (4)
Session 6  (3)
Session 7  (5)
Session 8  (4)
Session 9  (5)
Session 10  (4)
INTERNATIONAL CONFERENCE OF OPTICAL INSTRUMENT AND TECHNOLOGY
16-19 November 2008
Beijing, China
Front Matter: Volume 7160
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716001 (3 February 2009); doi: 10.1117/12.819868
Session 1
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716002 (3 February 2009); doi: 10.1117/12.817853
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716003 (3 February 2009); doi: 10.1117/12.804857
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716004 (3 February 2009); doi: 10.1117/12.804723
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716005 (3 February 2009); doi: 10.1117/12.805433
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716006 (3 February 2009); doi: 10.1117/12.805642
Session 2
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716007 (3 February 2009); doi: 10.1117/12.805691
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716009 (3 February 2009); doi: 10.1117/12.819841
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600A (3 February 2009); doi: 10.1117/12.806379
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600B (3 February 2009); doi: 10.1117/12.806388
Session 3
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600D (3 February 2009); doi: 10.1117/12.812030
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600E (3 February 2009); doi: 10.1117/12.806518
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600F (3 February 2009); doi: 10.1117/12.806524
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600G (3 February 2009); doi: 10.1117/12.806526
Session 4
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600H (3 February 2009); doi: 10.1117/12.806700
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600I (3 February 2009); doi: 10.1117/12.811957
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600J (3 February 2009); doi: 10.1117/12.806892
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600K (3 February 2009); doi: 10.1117/12.817856
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600L (3 February 2009); doi: 10.1117/12.817855
Session 5
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600M (3 February 2009); doi: 10.1117/12.805610
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600N (3 February 2009); doi: 10.1117/12.806998
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600O (3 February 2009); doi: 10.1117/12.806919
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600P (3 February 2009); doi: 10.1117/12.806955
Session 6
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600Q (3 February 2009); doi: 10.1117/12.806973
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600R (3 February 2009); doi: 10.1117/12.806991
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600S (3 February 2009); doi: 10.1117/12.806891
Session 7
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600T (3 February 2009); doi: 10.1117/12.806672
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600U (3 February 2009); doi: 10.1117/12.806758
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600V (3 February 2009); doi: 10.1117/12.816254
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600W (3 February 2009); doi: 10.1117/12.807013
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600X (3 February 2009); doi: 10.1117/12.811970
Session 8
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600Y (3 February 2009); doi: 10.1117/12.807043
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600Z (3 February 2009); doi: 10.1117/12.807049
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716010 (3 February 2009); doi: 10.1117/12.807066
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716012 (3 February 2009); doi: 10.1117/12.811966
Session 9
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716013 (3 February 2009); doi: 10.1117/12.811964
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716014 (3 February 2009); doi: 10.1117/12.806992
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716015 (3 February 2009); doi: 10.1117/12.807157
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716016 (3 February 2009); doi: 10.1117/12.807197
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716017 (3 February 2009); doi: 10.1117/12.808080
Session 10
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716018 (3 February 2009); doi: 10.1117/12.811589
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716019 (3 February 2009); doi: 10.1117/12.811813
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601A (3 February 2009); doi: 10.1117/12.811857
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601B (3 February 2009); doi: 10.1117/12.811955
Poster Session
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601C (3 February 2009); doi: 10.1117/12.804802
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601D (3 February 2009); doi: 10.1117/12.805502
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601E (3 February 2009); doi: 10.1117/12.805542
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601F (3 February 2009); doi: 10.1117/12.805547
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601G (3 February 2009); doi: 10.1117/12.805614
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601H (3 February 2009); doi: 10.1117/12.805722
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601I (3 February 2009); doi: 10.1117/12.805724
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601J (3 February 2009); doi: 10.1117/12.805917
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601K (3 February 2009); doi: 10.1117/12.806170
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601L (3 February 2009); doi: 10.1117/12.806374
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601M (3 February 2009); doi: 10.1117/12.806410
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601N (3 February 2009); doi: 10.1117/12.806498
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601O (3 February 2009); doi: 10.1117/12.806500
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601P (3 February 2009); doi: 10.1117/12.806504
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601R (3 February 2009); doi: 10.1117/12.806677
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601S (3 February 2009); doi: 10.1117/12.806689
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601T (3 February 2009); doi: 10.1117/12.806697
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601U (3 February 2009); doi: 10.1117/12.806708
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601V (3 February 2009); doi: 10.1117/12.806775
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601W (3 February 2009); doi: 10.1117/12.806792
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601X (3 February 2009); doi: 10.1117/12.806817
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601Y (3 February 2009); doi: 10.1117/12.806824
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601Z (3 February 2009); doi: 10.1117/12.806895
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716020 (3 February 2009); doi: 10.1117/12.806907
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716021 (3 February 2009); doi: 10.1117/12.806911
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716022 (3 February 2009); doi: 10.1117/12.806914
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716023 (3 February 2009); doi: 10.1117/12.806916
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716024 (3 February 2009); doi: 10.1117/12.806946
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716025 (3 February 2009); doi: 10.1117/12.806948
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716026 (3 February 2009); doi: 10.1117/12.806953
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716027 (3 February 2009); doi: 10.1117/12.806956
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716028 (3 February 2009); doi: 10.1117/12.806957
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716029 (3 February 2009); doi: 10.1117/12.806960
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602A (3 February 2009); doi: 10.1117/12.806963
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602C (3 February 2009); doi: 10.1117/12.806975
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602D (3 February 2009); doi: 10.1117/12.806931
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602E (3 February 2009); doi: 10.1117/12.806990
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602F (3 February 2009); doi: 10.1117/12.806993
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602G (3 February 2009); doi: 10.1117/12.806997
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602H (3 February 2009); doi: 10.1117/12.807004
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602I (3 February 2009); doi: 10.1117/12.807005
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602J (3 February 2009); doi: 10.1117/12.807009
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602K (3 February 2009); doi: 10.1117/12.807018
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602L (3 February 2009); doi: 10.1117/12.807022
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602M (3 February 2009); doi: 10.1117/12.807041
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602N (3 February 2009); doi: 10.1117/12.807046
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602O (3 February 2009); doi: 10.1117/12.807057
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602P (3 February 2009); doi: 10.1117/12.807076
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602Q (3 February 2009); doi: 10.1117/12.807079
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602S (3 February 2009); doi: 10.1117/12.807116
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602T (3 February 2009); doi: 10.1117/12.807128
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602U (3 February 2009); doi: 10.1117/12.807541
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602V (3 February 2009); doi: 10.1117/12.807823
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602W (3 February 2009); doi: 10.1117/12.808065
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602X (3 February 2009); doi: 10.1117/12.808083
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602Y (3 February 2009); doi: 10.1117/12.810892
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602Z (3 February 2009); doi: 10.1117/12.810985
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716030 (3 February 2009); doi: 10.1117/12.810995
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716031 (3 February 2009); doi: 10.1117/12.811071
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716033 (3 February 2009); doi: 10.1117/12.811460
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716035 (3 February 2009); doi: 10.1117/12.811997
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716036 (3 February 2009); doi: 10.1117/12.812000
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716037 (3 February 2009); doi: 10.1117/12.812017
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716038 (3 February 2009); doi: 10.1117/12.817414
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716039 (3 February 2009); doi: 10.1117/12.819853
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71603A (3 February 2009); doi: 10.1117/12.820718
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71603B (3 February 2009); doi: 10.1117/12.806194
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