3 February 2009 Interference fringe analysis using wavelet transform
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Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 716002 (2009); doi: 10.1117/12.817853
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China
Abstract
Fringe analysis methods that employ wavelet transform are described. The performances of the methods are examined from the viewpoints of required calculation time and accuracy. Further, accuracies of calculations performed using linear and logarithmic scales in wavelet transform are compared. Experimental results show that wavelet signal processing is effective in measuring profiles having large and gradual asperities.
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Takamasa Suzuki, Ryo Kiyohara, Mika Ichikawa, Osami Sasaki, "Interference fringe analysis using wavelet transform", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716002 (3 February 2009); doi: 10.1117/12.817853; https://doi.org/10.1117/12.817853
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KEYWORDS
Fourier transforms

Fringe analysis

Wavelets

Signal processing

Spatial frequencies

Wavelet transforms

Error analysis

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