Paper
2 February 2009 Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry
Dagong Jia, Changsong Yu, Tianhua Xu, Chao Jin, Hongxia Zhang, Wencai Jing, Yimo Zhang
Author Affiliations +
Abstract
In this paper, an electronic speckle-shearing pattern interferometer with pulsed laser and pulse frequency controller is fabricated. The principle of measuring the vibration in the object using electronic stroboscopic speckle--shearing pattern interferometer is analyzed. Using a metal plate, the edge of which is clamped, as an experimental specimen, the shear interferogram are obtained under two experimental frequencies, 100 Hz and 200 Hz. At the same time, the vibration of this metal plate under the same experimental conditions is measured using the time-average method in order to test the performance of this electronic stroboscopic speckle-shearing pattern interferometer. The result indicated that the fringe of shear interferogram become dense with the experimental frequency increasing. Compared the fringe pattern obtained by the stroboscopic method with the fringe obtained by the time-average method, the shearing interferogram of stroboscopic method is clearer than the time-average method. In addition, both the time-average method and stroboscopic method are suited for qualitative analysis for the vibration of the object. More over, the stroboscopic method is well adapted to quantitative vibration analysis.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dagong Jia, Changsong Yu, Tianhua Xu, Chao Jin, Hongxia Zhang, Wencai Jing, and Yimo Zhang "Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716014 (2 February 2009); https://doi.org/10.1117/12.806992
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Cited by 3 scholarly publications.
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KEYWORDS
Fringe analysis

CCD cameras

Interferometers

Interferometry

Vibrometry

Image processing

Light sources

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