The micro-strain measurement research of a double-microscopic of digital speckle correlation measurement

Kun Ma; Jiaquan Wu; Xiaoyu Chen; Li Xia; Sui Tang; Xunpeng Li

doi:10.1117/12.820718

2 February 2009 The micro-strain measurement research of a double-microscopic of digital speckle correlation measurement

Kun Ma, Jiaquan Wu, Xiaoyu Chen, Li Xia, Sui Tang, Xunpeng Li

Author Affiliations +

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 71603A (2009) https://doi.org/10.1117/12.820718
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

Digital speckle correlation method (DSCM) has been widely used in experimental mechanics to obtain the surface deformation fields. But one of the challenges in practical applications is how to obtain the high accuracy with micros-strain at the measurement precision of με. A double-microscopic of digital speckle correlation measurement is described in this paper. The design concept for the optical system, for which double microscope and double CCD is combined to measure micro-displacement in our experiment. The experiment shown the proposed correlation theory and measurement system method is sufficient satisfies the security engineering measurement needing.

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Kun Ma, Jiaquan Wu, Xiaoyu Chen, Li Xia, Sui Tang, and Xunpeng Li "The micro-strain measurement research of a double-microscopic of digital speckle correlation measurement", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71603A (2 February 2009); https://doi.org/10.1117/12.820718

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KEYWORDS

Speckle

Computing systems

Charge-coupled devices

Microscopes

Distance measurement

Experimental mechanics

Lithium

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