Reliability Considerations In Ti: LiNbO3 Guided Wave Devices

B E Kincald; M Dominguez

doi:10.1117/12.937487

23 February 1987 Reliability Considerations In Ti: LiNbO₃ Guided Wave Devices

B E Kincald, M Dominguez

Proceedings Volume 0717, Reliability Considerations in Fiber Optic Applications; (1987) https://doi.org/10.1117/12.937487
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States

Abstract

Fiber optic technology has made a very rapid transition from the research and development stage into practical operating systems. This transition has evolved in a natural progression towards more complex and demanding technology. This progression has resulted in wide application of multimooe systems and increasing deployment of single mode technology. Finally, optical-guided-wave and integrated-optical devices are beginning to emerge into the commercial arena. In all these cases, reliability is a prime concern that must be addressed. Considerable progress has been made in this area with regard to conventional multimove and single mode components and systems. However, the reliability aspects of optical-guided-wave ((JGW) devices are just beginning to be studied. This paper will discuss reliability considerations in TiLiNb03 puided-wave devices. These considerations will include material factors, device structures and designs, and packaging and connection of optical fiber pigtails. In the first category, processing/material factors will be reviewed and photorefractive, pyroelectric, and humidity effects will be discussed. The impact of packaging and pigtailing upon reliability will be covered. Test data on pigtailed 1i:LiNb03packaged devices under theermal, shock, and vibration exposure will be presented and discussed.

Citation Download Citation

B E Kincald and M Dominguez "Reliability Considerations In Ti: LiNbO₃ Guided Wave Devices", Proc. SPIE 0717, Reliability Considerations in Fiber Optic Applications, (23 February 1987); https://doi.org/10.1117/12.937487

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available