23 February 2009 Long-term wavelength stability of high-power laser diode bars on microchannel coolers
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Laser diode reliability depends on both power and spectral stability over time. This report examines cases in which both corrosion and ionic deposition resulted in wavelength shifts from less than 1 nm to greater than 7 nm in 60 - 100W bars on microchannel coolers. Both corrosion and deposition seemed to be exacerbated by frequent and/or lengthy periods of stagnation in the DI water system. Analytical results including SEM images of FIB cross-sections illustrate deposits of up to several microns thickness of dielectric (oxide) material, as well as voiding caused by corrosion of Ni-plating out from under Au-plating through pinhole defects. Thermal modeling confirms the effect of such features on thermal resistance, correlating to observed wavelength shifts. Actions taken to address these issues are discussed.
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David R. Balsley, David C. Dawson, Ryan Johnson, and Robert J. Martinsen "Long-term wavelength stability of high-power laser diode bars on microchannel coolers", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71980J (23 February 2009); doi: 10.1117/12.809925; https://doi.org/10.1117/12.809925

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