24 February 2009 A comprehensive model of catastrophic optical-damage in broad-area laser diodes
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Abstract
The present model of formation and propagation of catastrophic optical-damage (COD), a random failure-mode in laser diodes, was formulated in 1974 and has remained substantially unchanged. We extend the model of COD phenomena, based on analytical studies involving EBIC (electron-beam induced current), STEM (scanning transmission-electron microscopy) and sophisticated optical-measurements. We have determined that a ring-cavity mode, whose presence has not been previously reported, significantly contributes to COD initiation and propagation in broad-area laser-diodes.
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A. K. Chin, R. K. Bertaska, M. A. Jaspan, A. M. Flusberg, S. D. Swartz, M. T. Knapczyk, R. Petr, I. Smilanski, J. H. Jacob, "A comprehensive model of catastrophic optical-damage in broad-area laser diodes", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71981A (24 February 2009); doi: 10.1117/12.804834; https://doi.org/10.1117/12.804834
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KEYWORDS
Semiconductor lasers

Near field optics

Near field

Electroluminescence

Scanning transmission electron microscopy

Interfaces

Crystals

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