23 February 2009 Two-photon fluorescence microscopy with differential aberration imaging
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We report our progress in the development of Differential Aberration Imaging (DAI), a technique that enhances twophoton fluorescence (TPEF) microscopy by improving rejection of out-of-focus background by means of a deformable mirror (DM). The DM is used to intentionally add aberrations to the imaging system, which causes dramatic losses to in-focus signal while preserving the bulk of the out-of-focus background. By taking the difference between TPEF images with and without added aberrations, the out-of-focus portion of the signal is further rejected. We now introduce an implementation of DAI using a new type of DM that can be produced at much lower cost.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kengyeh K. Chu, Kengyeh K. Chu, Aymeric Leray, Aymeric Leray, Thomas G. Bifano, Thomas G. Bifano, Jerome Mertz, Jerome Mertz, } "Two-photon fluorescence microscopy with differential aberration imaging", Proc. SPIE 7209, MEMS Adaptive Optics III, 720903 (23 February 2009); doi: 10.1117/12.812230; https://doi.org/10.1117/12.812230


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