Analysis of surface plasmon resonance with Goos-Hanchen shift using FDTD method

Geum-Yoon Oh; Doo-Gun Kim; Hong-Seung Kim; Young-Wan Choi

doi:10.1117/12.809006

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9 February 2009 Analysis of surface plasmon resonance with Goos-Hanchen shift using FDTD method

Geum-Yoon Oh, Doo-Gun Kim, Hong-Seung Kim, Young-Wan Choi

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Proceedings Volume 7218, Integrated Optics: Devices, Materials, and Technologies XIII; 72180J (2009) https://doi.org/10.1117/12.809006
Event: SPIE OPTO: Integrated Optoelectronic Devices, 2009, San Jose, California, United States

Abstract

The Goos-Hanchen (GH) shift is observed from phase transition of the reflected light. However, the reported Artmann's equation is difficult to apply to drastic phase change of the critical and resonance angles because this equation is solved by differential of the phase shift. Therefore, the GH shift can be obtained from the structure optimized by the finite-difference time-domain method. In the surface plasmon resonance (SPR) phenomenon, positive and negative lateral shifts may result from the variation of incidence angle. The GH shift is very important to exactly detect the output power of the micro-size SPR sensor. The accurate positive and negative lateral shifts of -0.49 and +1.46 μm are obtained on the SPR with the incidence angles of 44.4° and 47°, respectively.

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Geum-Yoon Oh, Doo-Gun Kim, Hong-Seung Kim, and Young-Wan Choi "Analysis of surface plasmon resonance with Goos-Hanchen shift using FDTD method", Proc. SPIE 7218, Integrated Optics: Devices, Materials, and Technologies XIII, 72180J (9 February 2009); https://doi.org/10.1117/12.809006

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