19 January 2009 Basic theory on surface measurement uncertainty of 3D imaging systems
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Proceedings Volume 7239, Three-Dimensional Imaging Metrology; 723902 (2009); doi: 10.1117/12.804700
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
Three-dimensional (3D) imaging systems are now widely available, but standards, best practices and comparative data have started to appear only in the last 10 years or so. The need for standards is mainly driven by users and product developers who are concerned with 1) the applicability of a given system to the task at hand (fit-for-purpose), 2) the ability to fairly compare across instruments, 3) instrument warranty issues, 4) costs savings through 3D imaging. The evaluation and characterization of 3D imaging sensors and algorithms require the definition of metric performance. The performance of a system is usually evaluated using quality parameters such as spatial resolution/uncertainty/accuracy and complexity. These are quality parameters that most people in the field can agree upon. The difficulty arises from defining a common terminology and procedures to quantitatively evaluate them though metrology and standards definitions. This paper reviews the basic principles of 3D imaging systems. Optical triangulation and time delay (timeof- flight) measurement systems were selected to explain the theoretical and experimental strands adopted in this paper. The intrinsic uncertainty of optical distance measurement techniques, the parameterization of a 3D surface and systematic errors are covered. Experimental results on a number of scanners (Surphaser®, HDS6000®, Callidus CPW 8000®, ShapeGrabber® 102) support the theoretical descriptions.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Angelo Beraldin, "Basic theory on surface measurement uncertainty of 3D imaging systems", Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 723902 (19 January 2009); doi: 10.1117/12.804700; http://dx.doi.org/10.1117/12.804700
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KEYWORDS
Imaging systems

3D metrology

3D image processing

3D acquisition

Reflectivity

Laser scanners

Stereoscopy

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