19 January 2009 Dimensional measurement traceability of 3D imaging data
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Proceedings Volume 7239, Three-Dimensional Imaging Metrology; 72390E (2009); doi: 10.1117/12.816498
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
This paper discusses the concept of metrological traceability to the International System of Units (SI) unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to the traceability of 3D imaging data.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steve Phillips, Michael Krystek, Craig Shakarji, Kim Summerhays, "Dimensional measurement traceability of 3D imaging data", Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390E (19 January 2009); doi: 10.1117/12.816498; https://doi.org/10.1117/12.816498
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KEYWORDS
Calibration

Metrology

Standards development

Optical spheres

3D metrology

Imaging systems

Manufacturing

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